Altilium Pack Tester (portable) pro Mobile Phone Digital Products &
Overview
Pack robustum est comprehensive Dei applicantur ad basic intuentem probat Li-Ion altilium pack et tutela IC (supporting I2C, SMBus, HDQ communicationis protocols).
Basic Feature Test
• Open-voltage circuitu
• Lond voltage
• test onus Dynamic
• test ACIR;
• test Thr
• test IDR
• test prćcipiens intentione Northmanni
Normalis • test evacuatoria voltage
• test Capacitance
• test Leakage
IDR • / THR capacitance et imperium test on-off
Probat praesidio Feature
Per current praesidio • test, super præcipiens current praesidio munus, praesidio munus test mora temporis et convaluisset
Quisque ornare ipsum:
- Parum notae facile ferre
- Modularis consilium promptum habere
- Variis notitia fama
- reliability excelsis
- Convenient ad test notitia administratione et potestate sit, facile ad princeps securitatem et inuestigandum
- Test ieiunium celeritate (conventional nullus altilium administratione et praesidio felis test takes circiter 2 * est minus quam 100mS)
cubits:
|
Index |
cubits |
Sagaciter |
|
Aperta-voltage circuitu |
0.1 10V ~ |
± (+ 0.05% 0.01% ST dictum est) |
|
test ACIR |
MCCL mΩ 0 ~ |
± (+ 0.15% ST I mΩ) |
|
thr test |
1M CC ~ |
± (0.1% + ST 100Ω) |
|
1M * 3m |
± (0.1% + ST 500Ω) |
|
|
test IDR |
1M CC ~ |
± (0.1% + ST 100Ω) |
|
1M * 3m |
± (0.1% + ST 500Ω) |
|
|
Prćcipiens current test normalis (prćcipiens current, in tutelam & praesidium mora) |
0,1 2 A * |
± (+ 0.05% 0.01% ST dictum est) |
|
~ II 30A |
± (+ 0.02% 0.01% ST dictum est) |
|
|
Evacuatoria normalis current test (vena curationem, in tutelam & praesidium mora) |
0,1 2 A * |
± (+ 0.01% ST 0.5mA) |
|
~ II 30A |
± (+ 0.02% ST 0.5mA) |
|
|
test Capacitance |
X 0.1 ~ I. |
± (V% + ST 0.05uF) |
|
Praesidii expertus circuitus brevis (Per effectum praesidio mora) |
~ II 30A |
± (+ 0.02% ST 0.5mA) |
