China Nebula Mobile Phone & Digital Product Lithium Battery Pack Test System manufacturer and supplier |Nebula

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Nebula Mobile Phone & Digital Product Lithium Battery Pack Test System

Haec ratio apta est ad perpendendas proprietates fundamentales peractas vel semi-perfectas productas in linea productionis telephoniorum mobilium et digitalium productorum lithium batteries, praesertim ad praecipuas proprietates tutelae IC probationis et progressionem fasciculi systematis testium integrati (sustentans I2C, SMBus, HDQ, protocolla communicationis).

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FEATURES

Descriptio

Sarcina est ratio examinis comprehensiva applicata ad indolem fundamentalem et tutelam probatorum productorum finalium/semi-perfectorum productorum in telephono mobili et digitali producto Li-ion in altilium sarcinas linearum productionis et tutelam ICs (sustentans I2C, SMBus, HDQ protocolla communicationis ).

Systema probatum maxime compositum est ex experimentis faciendis et tutelae peractis experimentis.Test fundamentalis effectus test includit aperta-circuitu voltage test, test onus-voltage, test onus dynamicus, altilium resistentia interna test, scelerisque resistentia test, ID Resistentia test, normales testificans voltage test, normales voltage test, capacitas test, lacus test current;probatio tutelae persecutionis includit crimen super-currentis tutelae test: crimen super-current tutelae munus, mora temporis tutela et munus probatio recuperatio;missio super-current tutela test: functionis tutelae supra currentis functionis, mora temporis tutelam et functionem recuperationis probat;brevis-circuitu tutela test.

Systema explorationis his notis gaudet: Singulares canalis modularis propositi ac notitiarum functionis independens, quod non solum augere potest probatio uniuscuiusque celeritatis involucrum, sed etiam facile est conservare;dum tentat status tutelae fasciculi, probator debet flectere ad statum systematis respondentis.Instead of usura cursoriam, probat summus potentiae consumptio MOS probat contactum transitum ad augendae testis fidem.Et notitia testium in servo latere potest imposuisti, quod facile est regere, altum in securitate et non facile amittere.Systema explorationis non solum praebet eventus probationis "Loci datorum" rationum testium repositionis, sed etiam modum "servi repositionis remotioris".Omnes eventus probati in datorum exportari possunt, quod facile tractatur.Munus statisticum testium eventus "notitiarum" testium proventuum adhiberi potest ad analysin "ratam non-faciendi cuiuslibet rei probatae" et "crassa" cuiusque casus PCM.

Features

Modulare consilium: Independens unicum alvei modularis consilium ad facilem sustentationem	Princeps accurate: summa subtiliter voltage output±(0.01RD+0.01%FS)
Celeri test: cum velocissimo cursu 1.5s test, cycli productionis signanter accelerantur	Princeps reliability: summus power- consummatio MOS contactless switch ad augendae fidem testor
Moles compacta: parva satis et facile circumferre	--

SPECIFICATIONS

Model	BAT-NEPDQ-01B-V016
Parameter	Range	Sagacitas
Incurrentes voltage output	0.1~5V	±(0.01%RD +0.01%FS)
Incurrentes voltage output	5~10V	±(0.01%RD+0.02%FS )
Is dato mensurae voltage	0.1~5V	±(0.01%6R.D. +0.01%FS)
Is dato mensurae voltage	5~10V	±(0.01%RD +0.01%FS)
Incurrentes current output	0.1~2A	±(0.01%RD+0.5mA)
Incurrentes current output	2-20A	±(0.01%RD+0.02%FS)
Is dato current measurement	0.1~2A	±(0.01% RD+0.5mA)
Is dato current measurement	2- 20A	±(0.02% RD+0.5mA)
PAGE voltage measurement	0.1~10V	±(0.02% RD +0.5mV)
Dimittite voltage output	0.1~5V	±(0.01%RD +0.01%FS)
Dimittite voltage output	0.1~10V	±(0.01%RD+0.02%FS )
Dimittite voltage measurement	0.1~5V	±(0.01%RD +0.01%FS)
Dimittite voltage measurement	0.1-10V	±(0.01%RD +0.01%FS)
Dimittite current output	0.1~2A	±(0.01% RD+0.5mA)
Dimittite current output	2-30A	±(0.02% RD+0,02%FS)
Dimittite current measurement	0.1~-2A	±(0.01% RD+0.5mA)
Dimittite current measurement	2-30A	±(0.02% RD+0.5mA)
Current mensurae ultrices	0.1-20uA	±(0.01% RD+0.1uA)
Current mensurae ultrices	20-1000uA	±(0.01%RD +0.05%FS)